Design of testability pdf

Pdf design for testability in hardware software systems. Design for testability techniques zebo peng, ida, lithzebo peng, ida, lith tdts01 14 tdts01 lecture notes lecture 9lecture notes lecture 9 design for testability dft to take into account the testing aspects during the design process so that more testable designs will be generated. If each register could be observed and controlled, test problem reduces to testing combinational logic between registers. Design for manufacturability dfm and design for testability dft reporting are perhaps the best differentiators to identify a leading electronic contract manufacturer cm. Design for testability 5cmos vlsi designcmos vlsi design 4th ed. Lecture 14 design for testability testing basics stanford university. Design for testability techniques to optimize vlsi test cost swapneel b. Design for testability 14cmos vlsi designcmos vlsi design 4th ed. Observability the ability to observe a nodes value. Some problematic aspects of the objectoriented language paradigm are identified and some mitigation strategies are. Therefore, a systematic and wellstructured approach to designing ics to be testable is a must.

This is best accomplished by examining the hardware, software, and fixturing technologies that support combinational test. Sep 15, 2017 testability is the extent to which a piece of software can be tested. Design for testability jacob abraham department of electrical and computer engineering the university of texas at austin vlsi design fall 2019 november 7, 2019 ece department, university of texas at austin lecture 20. This course is intended for those involved in manufacturing, design, or test, who want a better. Some of the proposed guidelines have become obsolete because of technology and test system. Modular products and reconfigurable testing processes are crucial in modern manufacturing. Tck needs to be as free as possible of glitches and spikes, since all operations are triggered by rising and falling tck edges. Designing for testability university of north carolina at. Designing for testability helps assure that the product can be fully tested during the manufacturing process and final testing. Donglikar abstract high test data volume and long test application time are two major concerns for testing scan based circuits. Designing for testability 3 designing for testability summary this paper has three objectives. It is often assumed by friends and foes alike of intelligent design that a likelihood approach to design inferences will require evidence regarding the specific motives and abilities of any hypothetical designer. Electrical testability guidelines the most essential electrical testability requirement for a pcb design is to allow all freerunning clocks to be disabled figure 3.

Design the chip to increase observability and controllability. Two basic properties determine the testability of a node. Design for testability outline ad hoc design for testability techniques method of test points multiplexing and demultiplexing of test points time sharing of io for normal working and testing modes partitioning of registers and large combinational circuits scanpath design. Block 1 block 2 block 1 is not observable, block 2 is not controllable block 1 1 block 2 cp1 improving controllability. This paper discusses the concept of product modularity, test modules of increased reusability and exchangeability, and some aspects of design for testability. Design for testability strategies used in digital logic devices are summarized. Testability is the extent to which a piece of software can be tested. Design for testability techniques to optimize vlsi test cost. Ad hoc design for testability techniques method of test points. Pcb defects guide design for test design for testability. Design for testability slide 7cmos vlsi design manufacturing test a speck of dust on a wafer is sufficient to kill chipa speck of dust on a wafer is sufficient to kill chip.

Design for testability outline ad hoc design for testability techniques method of test points multiplexing and demultiplexing of test points time sharing of io for normal working and testing modes partitioning of registers and large combinational circuits scanpath design scanpath design concept. Design for testability in digital integrated circuits. The ability to set some circuit nodes to a certain states or logic values. With the growth in complexity of very large scale integration vlsi. Testability, likelihoods, and design lydia mcgrew abstract. For wirebond parts, isolate important nodes near the top for facedownc4 parts, isolate important node diffusions.

Delivering full text access to the worlds highest quality technical literature in engineering and technology. Awta 2 jan 2001 focused on software design for testability. For this purpose, testability analysis is performed at various design stages so that testability problems can be identified and fixed as early as possible. Design for testability dft dft techniques are design efforts specifically employed to ensure that a device in testable. Dfm and dft reports detect and address issues before they cost you money on the production line. Conflict between design engineers and test engineers. A key electronic contract manufacturing service that altron provides is design for testability guidelines. Exhaustive testing of circuits demands that all possible logic states in which a circuit can exist must be considered. Aug 31, 2016 o is a strategy to enhance the design testability without making much change to design style. Testing of circuits with a few hundred logic functions can, in general be performed by the use of selected logic stimuli mueldorf and savkav 1.

This can also include special circuit modifications or additions. Design for testability lectures testability of digital systems design for testability methods builtinselftestdiagnosis bistbisd practical works two laboratory works begin. Design for testability dft adhoc schemes ma ybet he easiest on design the yc an be the most dif. Designfortestability needs to be considered during layout to prevent signal integrity problems and ensure a working scan chain. Design for testability test for designability bob neal manufacturing test division agilent technologies loveland, colorado abstract. Design for testability dft to overcome functional board. Controllability the ability to set node to a specific value. In order to design for testability, it is necessary to have a basic understanding of the capability of the combinational tester to provide test and diagnostics. Testability is the term used to describe how easy it is to write automated tests for the system, class, or method to be tested. Design for testability dft2 supplementary material to accompany digital design principles and practices, fourth edition, by john f.

In addition, freerunning oscillators may induce noise not only into the immediate. Design for test pcb defects guide 2 electronics engineer may 2000 design for testability guidelines in an incircuit environment the growing complexity of high nodecount on printed circuit boards pcbs has made testing more difficult, bringing new challenges to manufacturers. The illinois scan ils architecture has been shown to be e. This effort provides a means of rating the testability of an electronic design at any stage in the design life.

Pdf design of modular digital circuits for testability. Pdf design for testability of circuits and systems. Ultimately, testability means having reliable and convenient interfaces to drive the execution and verification. Silicon debug test the first chips back from fabrication if you are lucky, they work the first time if not logic bugs vs. Test and design for testability of analog and mixedsignal. Ece 1767 design for test and testability outline eecg toronto. Controllability and observability controllabilitydeterminesthe work it takes to set up and run test cases and the extent to which individual functions and features of the. Stroud 909 design for testability 3 little if any performance impact critical paths can often be avoided target difficult to test target difficult to test subcircuits subcircuits potential for significant increase in fault coverage creative testability solutions on a casecreative testability solutions on a casebycase basis case basis.

Designing for manufacturability and testability has been addressed by numerous publications and papers in the past. Volume i, testability handbook, discusses the particulars of the circuit design and how they relate to. Design for testability design for testability dft dft techniques are design efforts specifically employed to ensure that a device in testable. The added features make it easier to develop and apply manufacturing tests to the designed hardware. Scan design is the most popular structured dft approach. Design for testability design for testability organization. At the same time, growing competition and high user. Designfortestability strategies used in digital logic devices are summarized.

Corelis can provide you with design consultation and an analysis of your design for boundaryscan testability. Tests are applied at several steps in the hardware manufacturing flow and, for certain p. Download fulltext pdf design for testability in hardware software systems article pdf available in ieee design and test of computers 3. Design for test aka design for testability or dft is a name for design techniques that add certain testability features to a microelectronic hardware product design. More like this memory design for testability and fault tolerance. Design for testability dft has migration recently from gate level to registertransfer level rtl vlsi test principles and architectures ee141 ch. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the products correct functioning. The student will learn what automated testing is, and the various types of automated testing. The conventional application is to identify areas of poor testability to guide testability enhancement, such as test point insertion, for improving the testability of the design. Designfortestability techniques improve the controllability and. Mar 24, 2017 this feature is not available right now. Design for testing or design for testability dft consists of ic design techniques that add testability features to a hardware product design. Designing the software testability test engineering medium. The ability to put a design into a known initial state, and then control and observe internal signal values.

A circuit is testable with respect to a fault set when each and every fault in this set is testable. May 06, 2018 design for manufacturability dfm and design for testability dft reporting are perhaps the best differentiators to identify a leading electronic contract manufacturer cm. Design for testability needs to be considered during layout to prevent signal integrity problems and ensure a working scan chain. In order to designfortestability, it is necessary to have a basic understanding of the capability of the combinational tester to provide test and diagnostics. And they will learn how design impacts the developers efforts. Design for manufacturability design for testability reporting. Overdriving an oscillator may cause test instability, due to the inability to squelch transients. As the result, special design techniques have to be used to make a chip fully testable. Simulation, verification, fault modeling, testing and metrics. Jan 12, 2012 design for testability when we talk about design for testability, we are talking about the architectural and design decisions in order to enable us to easily and effectively test our system. If you design a testability feature, you probably won.

Design for testability jacob abraham, november 7, 2019 1 38. Design for testability, scan registers and chains, dft architectures and algorithms, system level testing ps pdf bist architectures, lfsrs and signature analyzers ps pdf core testing ps pdf. And so this chapter will show how to design and build a software system in a way that increases its testability. They will learn the requirements of a developer who is being asked to write automated unit tests. Pdf design for testability in objectoriented systems. Design for testability in digital integrated circuits bob strunz, colin flanagan, tim hall university of limerick, ireland this course was developed with part funding from the eu under the comett. Testability in design build a number of test and debug features at design time this can include debugfriendly layout for wirebond parts, isolate important nodes near the top for facedownc4 parts, isolate important node diffusions this can also include special circuit modifications or additions. Build a number of test and debug features at design time this can include debugfriendly layout. In order to achieve a higher degree of testability, it has to be carefully considered right from the design phase throughout.

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